Automated Optical Inspection／wafer surface inspection system／YGK Corporation

Corporate

YGK Corporation

President/CEO

Shyuji Takaishi

Location

595-2, Kuruwada, Minami Alps City, Yamanashi, 400-0311, Japan
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TEL.　+81-55-284-6866
FAX.　+81-55-284-6867

Established

Apr 1994

Ｈｉｓｔｏｒｙ

Apr 1994

YGK Corporation is established.

Oct 1994

Particle counter and its related products.

Jul 1997

Ionizer and its related products.

Sep 1997

Alignment system for a magnetic card.

Oct 2000

Card workpiece delivery system.

Jan 2003

Particle counter for liquid.

Oct 2003

Extended factory.

Oct 2003

Develop new material for DLC application.

Mar 2004

Settling particle observation system for outdoor.

Apr 2007

Silicon edge inspection system.

Sep 2008

Wafer surface particle scanner with function of isolating surface for transparent material.

Jun 2009

Wafer surface particle scanner for small diameter.

Jul 2009

ESD monitor with auto distance function.

Mar 2011

Extended factory.