Tape frame wafer surface particle scanner
YPI-MX TF FOUP

Tape frame wafer surface particle scanner YPI-MX TF FOUP

Laser inspection system for unpatterned dicing wafer with tape frame.
For develop & pilot process lines.

Tape frame wafer surface particle scanner YPI-MX TF FOUP

Spec

ModelYPI-MX TF FOUP
Loading typeAuto loading
Dimension(W)2330 x (D)1400 x (H)1820mm (1 FOUP)
(W)2520 x (D)1807 x (H)2007mm (Dual FOUP)
Utility (Power)AC200V
Utility (Vacuum)-70kPa
-60kPa
-40kPa
Utility (Compressed air)0.6MPa
Wafer typeTape frame wafer & Wafers
Wafer size12inch tape frame wafer