Transparent wafer surface particle scanner
YPI-MX FOUP

Transparent wafer surface particle scanner 
YPI-MX  FOUP

Laser inspection system for unpatterned glass wafer.
For delivery inspection.
For wafer cleaning process.

Transparent wafer surface particle scanner 
YPI-MX  FOUP

Spec

ModelYPI-MX FOUP
Loading typeAuto loading
Dimension(W)2145 x (D)1340 x (H)1860mm
Utility (Power)AC200V
Utility (Vacuum)-70kPa
-40kPa
Utility(Compressed air)0.6MPa
Wafer typeSilicon, Transparent wafer (Quartz,  Glass)
Wafer size12inch