Transparent wafer surface particle scanner
YPI-MN(semi-automatic)

Laser inspection system for unpatterned wafer.
For process monitor.
For wafer cleaning process.
For R&D [None CE]

Transparent wafer surface particle scanner 
YPI-MN(semi-automatic)

Spec

ModelYPI-MN
Loading typeManual loading
Dimension(W)548 x (D)672 x (H)1009mm
Dimension (with stand)(W)740 x (D)780 x (H)1430mm
Utility (Power)AC200V
Utility (Vacuum)-70kPa
Wafer typeSilicon, Transparent wafer (Glass, Quartz, Sapphire)
Wafer size2-8inch