Semiconductor devices used in various products are created new value to society. YGK Corporation has taken part of this on to create new value in semiconductor wafer inspection.
We have light scattering technology as our core technology, and manufacture products that measure light scattering generated particles and scratches on wafer surface by laser light scanning.
We also have surface isolation measurement technology for transparent and translucent wafers, which generates both surface and backscattered light when a laser light is illuminated onto the wafer surface.
The technology can measure both opaque and transparent wafers by one unit, it expands to measure various wafers you want.
If you are interested in our product, please consider an evaluation or demonstration.

Demo products

Un-patterned wafer surface inspection system

YPI-MX
YPI-MX DC
YPI-MN