History

April 1994Established YGK CORPORATION, Developed “Particle counter”.
1997Relocated factory to current address.
2003Extension factory.
2007Developed inspection system for wafer edge.
2009Developed surface isolating function for transparent wafer
2010Developed inspection system for thin film on Roll to Roll.
2011Developed handy type of particle counter.
2012Received award of “Yamanashi Prefecture”
2013Developed desk top model of YPI-MN.
2014Developed YPI-MX-DC inspection system for Silicon carbide / Gallium nitride wafer
2017Developed enhanced control system for YPI-MX-DC
2020Developed tape frame inspection system for YPI-MX TF.
2022Acquired CE regulation.
2023Extension factory.
April 202430 years anniversary.
2024Developed XGS inspection system for glass polish confirmation.