Transparent wafer surface particle scanner
YPI-MX(semi-automatic)

Transparent wafer surface particle scanner 
YPI-MX(semi-automatic)

Laser inspection system for unpatterned glass wafer.
For delivery inspection.
For wafer cleaning process.

Transparent wafer surface particle scanner 
YPI-MX(semi-automatic)

Spec

ModelYPI-MX(semi-automatic)
Loading typeManual loading
Dimension(W)1000 x (D)1000 x (H)1810mm
Utility (Power)AC200V
Utility (Vacuum)-70kPa
-40kPa
Wafer typeSilicon, Transparent wafer (Quartz, LT/LN, Glass, Sapphire)
Wafer size2 – 8inch