Wafer surface particle scanner
YPI-MX FOUP

ウエウエハ表面パーティクルスキャナ YPI-MX FOUP

Laser inspection system for unpatterned wafer.
For process monitor.
For wafer cleaning process.
12inch wafers

ウエウエハ表面パーティクルスキャナ YPI-MX FOUP

Spec

ModelYPI-MX FOUP
Loading typeAuto loading with FOUP opener
Dimension(W)2145 x (D)1340 x (H)1860mm
Utility (Power)AC200V
Utility (Vacuum)-70kPa
-40kPa
Utility (Compressed air)0.6MPa
Wafer typeSilicon, filmed wafer
Wafer size12inch