Wafer surface particle scanner
YPI-MX

ウエハ表面パーティクルスキャナ YPI-MX

Laser inspection system for unpatterned wafer.
For process monitor.
For wafer cleaning process.
For mass-production.

ウエハ表面パーティクルスキャナ YPI-MX

Spec

ModelYPI-MX
Loading typeAuto loading
Dimension(W)1480 x (D)1220 x (H)1810mm
Utility (Power)AC200V
Utility (Vacuum)-70kPa
-40kPa
Wafer typeSilicon, filmed wafer, GaAs, InP
Wafer size2-8inch