Wafer surface particle scanner
YPI-MX
Laser inspection system for unpatterned wafer.
For process monitor.
For wafer cleaning process.
For mass-production.
Spec
Model | YPI-MX |
---|---|
Loading type | Auto loading |
Dimension | (W)1480 x (D)1220 x (H)1810mm |
Utility (Power) | AC200V |
Utility (Vacuum) | -70kPa -40kPa |
Wafer type | Silicon, filmed wafer, GaAs, InP |
Wafer size | 2-8inch |