YPI-MX-XYA/YPI-MX-ΘA Glass substrate/ Sapphire wafer surface inspection system. YPI-MX series(Auto loading type) Specialized to tune for a transparent
substrate.Apply to measure a rough
polishing of back of substrate.
Specifications
Work piece size
Maximum 200mm×200mm
(Contact us if you want to handle more than 200mm)
Scanning method
XY scanning or Rotation scanning
Inspection time
□200mm(X-Y)Approx. 4min
Φ200mm(Θ) Within 2min
Φ150mm(Θ) Within 1min 30sec
Φ100mm(Θ) Within 1min